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[
Low power scan test
] matched
2
Result(s)
No.
Title
Pub. Date
2
A New
Scan
Partition Scheme for
Low
-
Power
Embedded Systems
Hong-Sik Kim, Cheong-Ghil Kim, and Sungho Kang, ETRI Journal, vol.30, no.03, June 2008, pp 412-420
June 2008
1
Efficient
Test
Data Compression and
Low
Power
Scan
Test
ing in SoCs
Jun-Mo Jung, and Jong-Wha Chong, ETRI Journal, vol.25, no.5, Oct. 2003, pp 321-327
Oct. 2003
[1]
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