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[ Low power scan test ] matched 2 Result(s)
No. Title Pub. Date

2

A New Scan Partition Scheme for Low-Power Embedded Systems
Hong-Sik Kim, Cheong-Ghil Kim, and Sungho Kang, ETRI Journal, vol.30, no.03, June 2008, pp 412-420

June 2008

1

Efficient Test Data Compression and Low Power Scan Testing in SoCs
Jun-Mo Jung, and Jong-Wha Chong, ETRI Journal, vol.25, no.5, Oct. 2003, pp 321-327

Oct. 2003


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